Optical Parallels SERIES 157

:
MITUTOYO
• Designed to inspect parallelism and flatness of measuring faces of micrometers.
• Each set consists of 4 sizes to aid in testing parallelism at various angular positions of the micrometer spindle.

• Designed to inspect parallelism and flatness of measuring faces of micrometers.
• Each set consists of 4 sizes to aid in testing parallelism at various angular positions of the micrometer spindle.